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| Standard
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TTAK.KO-10.0566
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| Title |
Test Fixture Structure of Near Field Probe for Measuring Chip-Level EMC
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| Summary |
The main content of this standard is to define the specifications of circular test fixture which is used for Near Field Scanning Probe calibration.
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| Issued date
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2012-06-12
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| Download
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TTAK_KO-10_0566.pdf
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